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Mod-01 Lec-01 Introduction to Statistical Pattern Recognition |
Electronics Engineering |
55 min |
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Mod-01 Lec-02 Overview of Pattern Classifiers |
Electronics Engineering |
56 min |
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Mod-02 Lec-03 The Bayes Classifier for minimizing Risk |
Electronics Engineering |
57 min |
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Mod-02 Lec-04 Estimating Bayes Error; Minimax and Neymann-Pearson classifiers |
Electronics Engineering |
57 min |
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Mod-03 Lec-05 Implementing Bayes Classifier; Estimation of Class Conditional Densities |
Electronics Engineering |
58 min |
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Mod-03 Lec-06 Maximum Likelihood estimation of different densities |
Electronics Engineering |
58 min |
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Mod-03 Lec-07 Bayesian estimation of parameters of density functions, MAP estimates |
Electronics Engineering |
57 min |
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Mod-03 Lec-08 Bayesian Estimation examples; the exponential family of densities and ML est |
Electronics Engineering |
57 min |
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Mod-03 Lec-09 Sufficient Statistics; Recursive formulation of ML and Bayesian estimates |
Electronics Engineering |
58 min |
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Mod-04 Lec-10 Mixture Densities, ML estimation and EM algorithm |
Electronics Engineering |
57 min |
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Mod-04 Lec-11 Convergence of EM algorithm; overview of Nonparametric density estimation |
Electronics Engineering |
58 min |
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Mod-05 Lec-12 Nonparametric estimation, Parzen Windows, nearest neighbour methods |
Electronics Engineering |
58 min |
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Mod-06 Lec-13 Linear Discriminant Functions; Perceptron — Learning Algorithm and converge |
Electronics Engineering |
58 min |
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Mod-06 Lec-14 Linear Least Squares Regression; LMS algorithm |
Electronics Engineering |
58 min |
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Mod-06 Lec-15 AdaLinE and LMS algorithm; General nonliner least-squares regression |
Electronics Engineering |
58 min |
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Mod-06 Lec-16 Logistic Regression; Statistics of least squares method; Regularized Least S |
Electronics Engineering |
58 min |
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Mod-06 Lec-17 Fisher Linear Discriminant |
Electronics Engineering |
58 min |
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Mod-06 Lec-18 Linear Discriminant functions for multi-class case; multi-class logistic reg |
Electronics Engineering |
57 min |
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Mod-07 Lec-19 Learning and Generalization; PAC learning framework |
Electronics Engineering |
59 min |
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Mod-07 Lec-20 Overview of Statistical Learning Theory; Empirical Risk Minimization |
Electronics Engineering |
59 min |
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Mod-07 Lec-21 Consistency of Empirical Risk Minimization |
Electronics Engineering |
59 min |
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Mod-07 Lec-22 Consistency of Empirical Risk Minimization; VC-Dimension |
Electronics Engineering |
58 min |
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Mod-07 Lec-23 Complexity of Learning problems and VC-Dimension |
Electronics Engineering |
59 min |
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Mod-07 Lec-24 VC-Dimension Examples; VC-Dimension of hyperplanes |
Electronics Engineering |
59 min |
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Mod-08 Lec-25 Overview of Artificial Neural Networks |
Electronics Engineering |
59 min |
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Mod-08 Lec-26 Multilayer Feedforward Neural networks with Sigmoidal activation functions; |
Electronics Engineering |
59 min |
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Mod-08 Lec-27 Backpropagation Algorithm; Representational abilities of feedforward network |
Electronics Engineering |
59 min |
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Mod-08 Lec-28 Feedforward networks for Classification and Regression; Backpropagation in P |
Electronics Engineering |
59 min |
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Mod-08 Lec-29 Radial Basis Function Networks; Gaussian RBF networks |
Electronics Engineering |
58 min |
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Mod-08 Lec-30 Learning Weights in RBF networks; K-means clustering algorithm |
Electronics Engineering |
59 min |
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Mod-09 Lec-31 Support Vector Machines — Introduction, obtaining the optimal hyperplane |
Electronics Engineering |
59 min |
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Mod-09 Lec-32 SVM formulation with slack variables; nonlinear SVM classifiers |
Electronics Engineering |
59 min |
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Mod-09 Lec-33 Kernel Functions for nonlinear SVMs; Mercer and positive definite Kernels |
Electronics Engineering |
59 min |
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Mod-09 Lec-34 Support Vector Regression and ?-insensitive Loss function, examples of SVM l |
Electronics Engineering |
59 min |
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Mod-09 Lec-35 Overview of SMO and other algorithms for SVM |
Electronics Engineering |
58 min |
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Mod-09 Lec-36 Positive Definite Kernels; RKHS; Representer Theorem |
Electronics Engineering |
59 min |
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Mod-10 Lec-37 Feature Selection and Dimensionality Reduction; Principal Component Analysis |
Electronics Engineering |
59 min |
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Mod-10 Lec-38 No Free Lunch Theorem; Model selection and model estimation; Bias-variance t |
Electronics Engineering |
60 min |
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Mod-10 Lec-39 Assessing Learnt classifiers; Cross Validation; |
Electronics Engineering |
60 min |
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Mod-11 Lec-40 Bootstrap, Bagging and Boosting; Classifier Ensembles; AdaBoost |
Electronics Engineering |
60 min |
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Mod-11 Lec-41 Risk minimization view of AdaBoost |
Electronics Engineering |
59 min |
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